Journal of Electronic Testing

Journal of Electronic Testing: Theory and Applications is a peer-reviewed scientific journal published bimonthly by Springer Science+Business Media. Established in 1990, it covers developments in electronics testing, including tests of VLSI devices and printed circuit boards, as well as fault modeling and analysis.^[1] Its current editor-in-chief is Vishwani Agrawal (Auburn University).^[2]

Journal of Electronic Testing

Discipline	Electronics testing, electronics engineering
Language	English
Edited by	Vishwani Agrawal
Publication details
History	1986—present
Publisher	Springer
Frequency	Bimonthly
Impact factor	1.3 (2024)
Standard abbreviations ISO 4 (alt) · Bluebook (alt) NLM (alt) · MathSciNet (alt )
ISO 4	J. Electron. Test.
Indexing CODEN (alt · alt2) · JSTOR (alt) · LCCN (alt) MIAR · NLM (alt) · Scopus · W&L
ISSN	0923-8174 (print) 1573-0727 (web)
Links
Journal homepage Online access Online archive

Abstracting and indexing

The journal is abstracted and indexed in:

• Current Contents/Electronics & Telecommunications Collection^[3]
• Current Contents/Engineering/Computing & Technology^[3]
• EBSCO databases^[3]
• Ei Compendex^[4]
• Inspec^[3]
• ProQuest databases^[3]
• Science Citation Index Expanded^[5]
• Scopus^[3]

According to the Journal Citation Reports, the journal has a 2024 impact factor of 1.3.^[6]