Silicon tetrachloride (data page)

This page provides supplementary chemical data on silicon tetrachloride.

Material Safety Data Sheet

The handling of this chemical may incur notable safety precautions. It is highly recommend that you seek the Material Safety Datasheet (MSDS) for this chemical from a reliable source, it this case, noting that one should "avoid all contact! In all cases consult a doctor! ... inhalation causes sore throat and Burning sensation".^[1]

Structure and properties

Structure and properties
Index of refraction, nD	1.41156 at 25 °C
Abbe number	?
Dielectric constant, εr	2.248 ε0 at 0 °C
Bond strength	381 kJ/mol (Si-Cl)
Bond length	?
Bond angle	109° (Cl-Si-Cl)
Dipole#Molecular dipoles	0 D
Magnetic susceptibility	−87.5
Viscosity	99.4 mPa.s at 25 °C 96.2 mPa.s at 50 °C
Thermal conductivity	0.099 W/(m K) at 25 °C 0.096 W/(m K) at 50 °C

Thermodynamic properties

Phase behavior
Triple point	? K (? °C), ? Pa
Critical point	508.1 K (235.0 °C), 3.593 MPa, 0.326vdm3/mol
Std enthalpy change of fusion, ΔfusHo	7.60 kJ/mol
Std entropy change of fusion, ΔfusSo	? J/(mol·K)
Std enthalpy change of vaporization, ΔvapHo	28.7 kJ/mol
Std entropy change of vaporization, ΔvapSo	? J/(mol·K)
Solid properties
Std enthalpy change of formation, ΔfHosolid	? kJ/mol
Standard molar entropy, Sosolid	? J/(mol K)
Heat capacity, cp	? J/(mol K)
Liquid properties
Std enthalpy change of formation, ΔfHoliquid	−687.0 kJ/mol
Std Gibbs free energy of formation, ΔfGoliquid	−619.8 kJ/mol
Standard molar entropy, Soliquid	239.7 J/(mol K)
Heat capacity, cp	145. J/(mol K)
Gas properties
Std enthalpy change of formation, ΔfHogas	−657. kJ/mol
Std Gibbs free energy of formation, ΔfGogas	−617.0 kJ/mol
Standard molar entropy, Sogas	330.7 J/(mol K)
Heat capacity, cp	90. J/(mol K)

Spectral data

UV-Vis
λmax	? nm
Extinction coefficient, ε	?
IR
Major absorption bands	610, 642 cm−1
NMR
Proton NMR
Carbon-13 NMR
Other NMR data
MS
Masses of main fragments	133, 135, 170

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• Except where noted otherwise, data relate to Standard temperature and pressure.
• Reliability of data general note.