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X-Ray Spectrometry (journal)

Academic journal From Wikipedia, the free encyclopedia

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X-Ray Spectrometry is a bimonthly peer-reviewed scientific journal established in 1972 and published by John Wiley & Sons. It covers the theory and application of X-ray spectrometry. The current editor-in-chiefs are Johan Boman (University of Gothenburg) and Liqiang Luo (National Research Center of Geoanalysis).

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Abstracting and indexing

The journal is abstracted and indexed in:

According to the Journal Citation Reports, the journal has a 2020 impact factor of 1.488, ranking it 30th out of 43 journals in the category "Spectroscopy".[1]

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Notable articles

The highest-cited articles from this journal are:

  1. Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; Van Espen, P. (1994). "Analysis of X-ray spectra by iterative least squares (AXIL): New developments". X-Ray Spectrometry. 23 (6): 278. doi:10.1002/xrs.1300230609.
  2. Packwood, R. H.; Brown, J. D. (1981). "A Gaussian expression to describe φ(ρz) curves for quantitative electron probe microanalysis". X-Ray Spectrometry. 10 (3): 138. doi:10.1002/xrs.1300100311.
  3. Norrish, K.; Hutton, J. T. (1977). "Plant analyses by X-ray spectrometry I—Low atomic number elements, sodium to calcium". X-Ray Spectrometry. 6: 6–11. doi:10.1002/xrs.1300060104.
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References

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