Academic Aptitude Test

The Academic Aptitude Test^[1] (AAT; 學業能力測驗) is a test conducted by the Hong Kong Education Department from 1978 to 2000 in conjunction with the Secondary School Place Allocation System. The candidates of the test were students studying in the sixth grade of primary schools.

Academic Aptitude Test
Traditional Chinese	香港學業能力測驗
Transcriptions Yue: Cantonese Yale Romanization Hēung góng hohk yihp nàhng lihk chāk yihm Jyutping Hoeng1 gong2 hok6 jip6 nang4 lik6 cak1 jim6
HKAAT
Traditional Chinese	學能測驗
Transcriptions Yue: Cantonese Yale Romanization Hohk nàhng chāk yihm Jyutping Hok6 nang4 cak1 jim6

Before the abolishment of the test in 2000, this test, together with the Hong Kong Certificate of Education Examination and the Hong Kong Advanced Level Examination, were known as the three major public examinations in Hong Kong.

History

The test was designed to create a common ground in measuring different school systems and began in 1978 as part of the Secondary School Places Allocation (SSPA) scheme. HKAAT aimed to test student logic, reasoning, and classification ability.